{"id":554,"date":"2024-04-29T00:58:38","date_gmt":"2024-04-29T00:58:38","guid":{"rendered":"https:\/\/src.cikeys.com\/2024\/?page_id=554"},"modified":"2024-04-29T00:58:39","modified_gmt":"2024-04-29T00:58:39","slug":"measuring-thin-film-thickness-using-uv-visible-reflectance-spectroscopy","status":"publish","type":"page","link":"https:\/\/src.cikeys.com\/2024\/conference-schedule\/poster-presentations\/poster-presentations-session-3\/measuring-thin-film-thickness-using-uv-visible-reflectance-spectroscopy\/","title":{"rendered":"Measuring Thin Film Thickness Using UV-Visible Reflectance Spectroscopy"},"content":{"rendered":"\n<h2 class=\"wp-block-heading\">Bryan Alamillo, &amp; Dr. Brittnee Veldman<\/h2>\n\n\n\n<div class=\"wp-block-columns is-layout-flex wp-container-core-columns-is-layout-8f761849 wp-block-columns-is-layout-flex\">\n<div class=\"wp-block-column is-layout-flow wp-block-column-is-layout-flow\" style=\"flex-basis:66.66%\">\n<p class=\"wp-block-paragraph\">This research works on developing a cost-effective, reliable method to measure thin film thicknesses of non-absorbing materials such as silicon dioxide(SiO2). By doing this, the development of low-cost techniques can open pathways to democratize materials research, which tends to be prohibitively expensive. The methods involved include the characterization of high-capacitance materials and the repurposing of an available UV visible spectrometer and reflectance probe. We are taking freeware, such as OceanView from Ocean Optics, and developing a thin film characteristic technique measurement utilizing refractive indices. The system is calibrated using silicon(Si) and SiO2 thin films as a reference. As a result, we are expected to find the values to align with the actual thicknesses of the samples, but the calibrations and formulas may need adjustment for that. Future steps include using the refractive index of other materials to make films and calibrating the results using physical means, such as atomic force microscopy, at facilities like the University of California, Santa Barbara (UCSB). Once we have those references and good calibrations, we can apply the technique to other materials and further prove its viability.<\/p>\n<\/div>\n\n\n\n<div class=\"wp-block-column is-layout-flow wp-block-column-is-layout-flow\" style=\"flex-basis:33.33%\">\n<p class=\"wp-block-paragraph\"><a href=\"https:\/\/src.cikeys.com\/2024\/conference-schedule\/poster-presentations\/\"><strong>Poster Presentation<\/strong><\/a><\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><a href=\"https:\/\/src.cikeys.com\/2024\/conference-schedule\/poster-presentations\/poster-presentations-session-3\/\">Session 3<\/a><\/p>\n\n\n\n<p class=\"wp-block-paragraph\">2:45pm&nbsp;<strong>\u2013<\/strong>&nbsp;4:00pm<br>Grand Salon<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Chemistry<\/strong><\/p>\n<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<p>Bryan Alamillo, &amp; Dr. Brittnee Veldman This research works on developing a cost-effective, reliable method to measure thin film thicknesses of non-absorbing materials such as silicon dioxide(SiO2). By doing this, the development of low-cost techniques can open pathways to democratize materials research, which tends to be prohibitively expensive. The methods involved include the characterization of [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":48,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"categories":[5,8],"tags":[29],"class_list":["post-554","page","type-page","status-publish","hentry","category-poster-presentations","category-session-3","tag-chemistry","post"],"_links":{"self":[{"href":"https:\/\/src.cikeys.com\/2024\/wp-json\/wp\/v2\/pages\/554","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/src.cikeys.com\/2024\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/src.cikeys.com\/2024\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/src.cikeys.com\/2024\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/src.cikeys.com\/2024\/wp-json\/wp\/v2\/comments?post=554"}],"version-history":[{"count":1,"href":"https:\/\/src.cikeys.com\/2024\/wp-json\/wp\/v2\/pages\/554\/revisions"}],"predecessor-version":[{"id":604,"href":"https:\/\/src.cikeys.com\/2024\/wp-json\/wp\/v2\/pages\/554\/revisions\/604"}],"up":[{"embeddable":true,"href":"https:\/\/src.cikeys.com\/2024\/wp-json\/wp\/v2\/pages\/48"}],"wp:attachment":[{"href":"https:\/\/src.cikeys.com\/2024\/wp-json\/wp\/v2\/media?parent=554"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/src.cikeys.com\/2024\/wp-json\/wp\/v2\/categories?post=554"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/src.cikeys.com\/2024\/wp-json\/wp\/v2\/tags?post=554"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}